TIRF Penetration Depth Calculator

Evanescent intensity penetration depth, critical angle, objective angle limit and interface intensity for TIRF microscopy.

Model: Exact

Results

Critical angle θ_c61.18°
Objective's largest angle78.98°
Intensity penetration depth d110.3 nm
Field decay length 2d220.7 nm
Intensity at 100 nm40.4 %
Interface intensity, s-pol.3.07 × incident
Interface intensity, p-pol.3.93 × incident

Penetration depth vs angle

Evanescent intensity decay

Model

θ_c = arcsin(n₂/n₁); objective limit arcsin(NA/n₁)

I(z) = I(0) exp(−z/d), d = λ/(4π √(n₁² sin²θ − n₂²))

I_s(0) = 4cos²θ/(1 − n²), I_p(0) = 4cos²θ(2sin²θ − n²)/(n⁴cos²θ + sin²θ − n²), n = n₂/n₁

Plane-wave Fresnel optics at one planar interface (Axelrod 2001). d is the 1/e depth of the intensity, which excites the fluorophores; the field decays over 2d. The interface intensity is relative to the incident intensity in the glass and peaks near θ_c (4 for s, 4/n² for p). Real objective-type TIRF also carries some scattered, non-evanescent light, so the measured decay is often longer.

Model and references

Exact. The equations are exact within the stated assumptions, or are a standard's tabulated values. The results are as good as the inputs. About the tiers

Plane-wave Fresnel optics at a single planar interface. Objective-type TIRF also carries scattered, non-evanescent light, so measured decays are often longer.

  1. Axelrod D. (2001). Total internal reflection fluorescence microscopy in cell biology. Traffic 2, 764–774. Penetration depth (eq. 2) and interface intensities for s and p polarisation (eqs. 4–5). doi:10.1034/j.1600-0854.2001.21104.x
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